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स्रोत भाषा
अनुबाद गर्नुपर्ने भाषा
नतिजा 1 - 1 (जम्मा लगभग 1)
1
411
स्रोत भाषा
özet
The atomic force microscope (AFM) is ideally suited for characterizing nanoparticles. It offers the capability of 3D
visualization and both qualitative and quantitative information on many physical properties including size, morphology,
surface texture and roughness. Statistical information, including size, surface area, and volume distributions,
can be determined as well. A wide range of particle sizes can be characterized in the same scan, from 1 nanometer
to 8 micrometers.
सिद्धिएका अनुबादहरु
Atomik Kuvvet Mikroskopu
1